ZYGO ZMI-2002

Description

ZYGO ZMI-2002

ZYGO ZMI-2002是一款高性能的表面形貌测量仪器，专为精确测量各种材料表面的微观形貌和表面粗糙度而设计。该仪器采用先进的干涉测量技术，能够提供非接触式、高精度的表面形貌分析。

规格：

• 测量范围：根据具体型号而定
• 分辨率：纳米级
• 测量速度：快速测量
• 环境要求：无尘、恒温、恒湿

作用特征：

• 高精度测量： 采用先进的干涉测量技术，能够提供高精度的表面形貌测量。
• 非接触式测量： 避免了对被测表面的损伤和污染，适用于对表面质量要求较高的应用场景。
• 快速测量： 测量速度快，提高了生产效率。
• 操作简便： 仪器操作简单，易于上手。

应用领域：
ZYGO ZMI-2002广泛应用于半导体、光学、精密机械等工业领域，用于测量和评估材料表面的微观形貌和粗糙度，以确保产品质量和生产过程的稳定性。

 

The ZYGO ZMI-2002 is a high-performance surface topography measurement instrument specifically designed for precise measurement of micro-scale surface features and roughness of various materials. This instrument utilizes advanced interferometric measurement technology to provide non-contact, high-accuracy surface topography analysis.

Specifications:

• Measurement Range: Depends on the specific model
• Resolution: Nanometer-level
• Measurement Speed: Fast measurement
• Environmental Requirements: Dust-free, constant temperature, constant humidity

Features:

• High-Accuracy Measurement: Utilizes advanced interferometric measurement technology to provide precise surface topography measurements.
• Non-Contact Measurement: Avoids damage and contamination to the measured surface, suitable for applications with high surface quality requirements.
• Fast Measurement: Quick measurement speed, enhancing production efficiency.
• Easy Operation: Simple and intuitive instrument operation.

Application Fields:
The ZYGO ZMI-2002 is widely used in industrial fields such as semiconductors, optics, precision machinery, etc., for measuring and evaluating the micro-scale surface features and roughness of materials to ensure product quality and stability in production processes.

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